Horiba Announces A New, Entry-level Multimodal Characterization System For True Simultaneous Colocalized Measurements

PISCATAWAY, NJ — March 4, 2025 — HORIBA, a world leader successful analytical and measurement technologies, proudly announces nan motorboat of nan SignatureSPM™, a new, multimodal characterization strategy built connected an automated Atomic Force Microscopy (AFM) level and integrated pinch a Raman/photoluminescence spectrometer. This innovative strategy enables simultaneous, colocalized measurements and delivers unparalleled insights into nan beingness and chemic properties of materials.

SignatureSPM is simply a microscope built connected a multimodal characterization platform, integrating an automated Atomic Force Microscope (AFM) pinch a Raman/Photoluminescence spectrometer, enabling existent colocalized measurements of beingness and chemic properties. 

Image Credit: HORIBA Scientific UK

SignatureSPM offers broad analyses of topographic, mechanical, electrical, magnetic, optical, and chemic information successful a single, real-time measurement. This integrated solution requires little sample handling and provides faster colocalized information acquisition which streamlines workflow and provides results successful little time.

The SignatureSPM combines AFM pinch Raman and photoluminescence spectroscopy to heighten chemic identification. It is easy to use, has a minimal learning curve enabling users to commencement measurements successful nether 5 minutes. Its stability, speed, and easiness of usage make it perfect for nanotechnology investigation and worldly characterization.

The SignatureSPM is based connected nan proven capacity of nan SmartSPM package that combines an AFM scanner, NIR feedback laser, afloat automation of AFM probe alignment, extremity attack and AFM feedback optimization, including nan move scan complaint accommodation without nan image distortion.

The SignatureSPM’s AFM tin execute ample scans and molecular resolution, prioritizing stableness done accelerated consequence time, debased noise, debased drift, and metrological traceability. Control algorithms, supported by nan integer controller, alteration unprecedented scanning speeds and high-resolution imaging, moreover during online velocity changes.

Combining AFM pinch Raman spectroscopy and photoluminescence allows for simultaneous study of a material's aboveground topography, chemic composition, and physics properties astatine nan nanoscale. This provides a broad knowing of a sample's building and functionality pinch precise spatial relationship betwixt nan different information types, which is peculiarly useful successful fields for illustration materials science, chemistry, biology, nanotechnology, semiconductor research, and life sciences. Critically, nan NIR feedback allows existent light-on / light-off measurements for photosensitive materials.

SignatureSPM has afloat integrated aggregate AFM modes including:

• Kelvin Probe Microscopy
• Piezo Response Force Microscopy
• Magnetic Force Microscopy
• Nanolithography
• Force-Curve Measurements

“The creation of nan SignatureSPM was driven by HORIBA’s committedness to create innovative analytical and automation solutions that reside nan needs of scientists and researchers,” said Joao-Lucas Rangel, AFM & AFM-Raman Product Manager astatine HORIBA. “The SignatureSPM will alteration precise, multimodal measurements, making it a highly applicable instrumentality for cutting-edge research.”

For much accusation astir nan caller SignatureSPM Multimodal Characterization system, please spell to HORIBA.com